Difference between revisions of "Challenge Assignments"
Jump to navigation
Jump to search
Sfrancisco (talk | contribs) (Added contributors) |
Sfrancisco (talk | contribs) (Added category) |
||
| (One intermediate revision by the same user not shown) | |||
| Line 66: | Line 66: | ||
<references/> | <references/> | ||
[[Category:Design_patterns]] <!-- List of other categories the design pattern belongs to. The syntax for linking to a category is: [[Category:<Name of category]] --> | [[Category:Design_patterns]] [[Category:Patlet]] [[Category:Flipped Classroom Patterns]] [[Category:Traditional Classroom]]<!-- List of other categories the design pattern belongs to. The syntax for linking to a category is: [[Category:<Name of category]] --> | ||
Latest revision as of 07:06, 15 May 2017
| Challenge Assignments | |
| Contributors | Christian Köppe, Ralph Niels, Robert Holwerda, Lars Tijsma, Niek Van Diepen, Koen Van Turnhout, René Bakker, Stijn Hoppenbrouwers |
|---|---|
| Last modification | May 15, 2017 |
| Source | Köppe et al. (2015)[1]; Köppe et al. (2016)[2] |
| Pattern formats | OPR Alexandrian |
| Usability | |
| Learning domain | |
| Stakeholders | |
Offer additional assignments for students who had no trouble acquiring the concepts with the standard material in order to challenge them to go learn more.[1]
Context
Problem
Forces
Solution
Consequences
Benefits
Liabilities
Evidence
Literature
Discussion
Data
Applied evaluation
Related patterns
Example
References
- ↑ 1.0 1.1 Patlet first mentioned in Köppe, C., Niels, R., Holwerda, R., Tijsma, L., Van Diepen, N., Van Turnhout, K., Bakker, R., (2015). Flipped Classroom Patterns - Designing Valuable In-Class Meetings. In Proceedings of the 20th European Conference on Pattern Languages of Programs (EuroPLoP 2015). New York:ACM.
- ↑ Pattern first published in Köppe, C., Niels, R., Bakker, R., & Hoppenbrouwers, S. (2016). Flipped Classroom Patterns-Controlling the Pace. In Proceedings of the 10th Travelling Conference on Pattern Languages of Programs (VikingPLoP 2016). New York:ACM.