Low Resolution-Often Repeated
| Low Resolution-Often Repeated | |
| Contributors | Joseph Bergin, Christian Kohls, Christian Köppe, Yishay Mor, Michel Portier, Till Schümmer, Steven Warburton |
|---|---|
| Last modification | June 5, 2017 |
| Source | Bergin et al. (2016)[1] |
| Pattern formats | OPR Alexandrian |
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| Learning domain | |
| Stakeholders | |
Rather than a few high risk assessments in a course, use many low impact measures that accumulate.
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References
- ↑ Bergin, J., Kohls, C., Köppe, C., Mor, Y., Portier, M., Schümmer, T., & Warburton, S. (2016). Student's choice of assessment. In Proceedings of the 21st European Conference on Pattern Languages of Programs (EuroPLoP 2016) (p. 22). New York:ACM.